ECORCE TCAD

Technology Computer-Aided Design (TCAD)

Discover ECORCE TCAD Software to study impact of Radiation effects on Semiconductor Devices with Total Ionizing Dose (TID), Total Non Ionizing Dose (TNID) and Single Event Effects (SEE) Modeling.

We analyze, design experiment and perform modeling to understand radiation effects and propose solutions.

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What We Do

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ECORCE TCAD

We develop ECORCE TCAD Software that is a multidimensional device simulator capable of Total Ionizing Dose, Total Non Ionizing Dose and Single Event Effects modeling on silicon-based and compound semiconductor devices. It is the only TCAD tool that provides a dynamic mesh generator insuring fast and precise modeling in one shot. We provide annual licenses for individual computers or full site.

Case Studies

Using experiments and ECORCE TCAD modelling, we analyze your problem and propose solutions about semiconductor device sensitivity to radiation effects (TID/SEE), device failures analysis, experiments interpretation, new devices qualification and heat diffusion mapping.