ECORCE TCAD

Technology Computer-Aided Design (TCAD)

Discover our user-friendly ECORCE TCAD Software to study impact of Radiation effects on Semiconductor Devices with Total Ionizing Dose (TID), Total Non Ionizing Dose (TNID) and Single Event Effects (SEE) Modeling.

We analyze, design experiment and perform modeling to understand radiation effects and propose solutions.

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What We Do

#1

ECORCE TCAD

We develop ECORCE TCAD, a multidimensional device simulator for radiation effects modeling on silicon and compound semiconductors. ECORCE accurately simulates Total Ionizing Dose (TID), Total Non-Ionizing Dose (TNID), and Single Event Effects (SEE). It is the only TCAD tool with a dynamic mesh generator, enabling fast, precise simulations in a single run. We offer annual licenses for individual computers or full-site deployment.

Case Studies

Using ECORCE TCAD simulations and experimental data, we analyze semiconductor device sensitivity to radiation effects (TID/SEE). We provide solutions for device failure analysis, experiment interpretation, new device qualification, and heat diffusion mapping, helping engineers design robust, high-reliability electronics.

#3

Training

We offer training courses on radiation effects in electronic components and semiconductor physics, with comprehensive tutorials and video support. Our programs help engineers and researchers gain practical knowledge in TID, SEE, and device reliability.