What We Do
Using experiments and ECORCE TCAD modelling, we analyze your problem and propose solutions about semiconductor device sensitivity to radiation effects (TID/SEE), device failures analysis, experiments interpretation, new devices qualification and heat diffusion mapping.
We offer training courses on radiation effects on electronic components and semiconductor physics. We provide tutorial and video supports.
Why Choose Me
Our expertise applies to all fields which face problem of components design and components under radiation:
Nuclear Power Plant